A technique for the examination of polar ice using the scanning electron microscope
Summary The microstructure and location of impurities in polar ice are of great relevance to ice core studies. We describe a reliable method to examine ice in the scanning electron microscope (SEM). Specimens were cut in a cold room and could have their surfaces altered by sublimation either before...
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crwiley:10.1046/j.0022-2720.2001.00981.x 2024-06-02T08:08:08+00:00 A technique for the examination of polar ice using the scanning electron microscope Barnes, P. R. F. Mulvaney, R. Wolff, E. W. Robinson, K. 2002 http://dx.doi.org/10.1046/j.0022-2720.2001.00981.x https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1046%2Fj.0022-2720.2001.00981.x https://onlinelibrary.wiley.com/doi/pdf/10.1046/j.0022-2720.2001.00981.x en eng Wiley http://onlinelibrary.wiley.com/termsAndConditions#vor Journal of Microscopy volume 205, issue 2, page 118-124 ISSN 0022-2720 1365-2818 journal-article 2002 crwiley https://doi.org/10.1046/j.0022-2720.2001.00981.x 2024-05-03T11:29:55Z Summary The microstructure and location of impurities in polar ice are of great relevance to ice core studies. We describe a reliable method to examine ice in the scanning electron microscope (SEM). Specimens were cut in a cold room and could have their surfaces altered by sublimation either before (pre‐etching) or after (etching) introduction to the cryo‐chamber of the SEM. Pre‐etching was used to smooth surfaces, whilst etching stripped away layers from the specimen surface, aiding the location of particles in situ , and allowing embedded structures to be revealed. X‐ray analysis was used to determine the composition of localized impurities, which in some cases had been concentrated on the surface by etching. Examining uncoated surfaces was found to be advantageous and did not detract from qualitative X‐ray analysis. Imaging uncoated was performed at low accelerating voltages and probe currents to avoid problems of surface charging. Article in Journal/Newspaper ice core Wiley Online Library Journal of Microscopy 205 2 118 124 |
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Open Polar |
collection |
Wiley Online Library |
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crwiley |
language |
English |
description |
Summary The microstructure and location of impurities in polar ice are of great relevance to ice core studies. We describe a reliable method to examine ice in the scanning electron microscope (SEM). Specimens were cut in a cold room and could have their surfaces altered by sublimation either before (pre‐etching) or after (etching) introduction to the cryo‐chamber of the SEM. Pre‐etching was used to smooth surfaces, whilst etching stripped away layers from the specimen surface, aiding the location of particles in situ , and allowing embedded structures to be revealed. X‐ray analysis was used to determine the composition of localized impurities, which in some cases had been concentrated on the surface by etching. Examining uncoated surfaces was found to be advantageous and did not detract from qualitative X‐ray analysis. Imaging uncoated was performed at low accelerating voltages and probe currents to avoid problems of surface charging. |
format |
Article in Journal/Newspaper |
author |
Barnes, P. R. F. Mulvaney, R. Wolff, E. W. Robinson, K. |
spellingShingle |
Barnes, P. R. F. Mulvaney, R. Wolff, E. W. Robinson, K. A technique for the examination of polar ice using the scanning electron microscope |
author_facet |
Barnes, P. R. F. Mulvaney, R. Wolff, E. W. Robinson, K. |
author_sort |
Barnes, P. R. F. |
title |
A technique for the examination of polar ice using the scanning electron microscope |
title_short |
A technique for the examination of polar ice using the scanning electron microscope |
title_full |
A technique for the examination of polar ice using the scanning electron microscope |
title_fullStr |
A technique for the examination of polar ice using the scanning electron microscope |
title_full_unstemmed |
A technique for the examination of polar ice using the scanning electron microscope |
title_sort |
technique for the examination of polar ice using the scanning electron microscope |
publisher |
Wiley |
publishDate |
2002 |
url |
http://dx.doi.org/10.1046/j.0022-2720.2001.00981.x https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1046%2Fj.0022-2720.2001.00981.x https://onlinelibrary.wiley.com/doi/pdf/10.1046/j.0022-2720.2001.00981.x |
genre |
ice core |
genre_facet |
ice core |
op_source |
Journal of Microscopy volume 205, issue 2, page 118-124 ISSN 0022-2720 1365-2818 |
op_rights |
http://onlinelibrary.wiley.com/termsAndConditions#vor |
op_doi |
https://doi.org/10.1046/j.0022-2720.2001.00981.x |
container_title |
Journal of Microscopy |
container_volume |
205 |
container_issue |
2 |
container_start_page |
118 |
op_container_end_page |
124 |
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1800753308865921024 |