Measurements of the Electrical Properties of Ice Ih Single Crystals by Admittance and Thermally Stimulated Depolarization Techniques
Abstract Ice Ih single crystals were investigated by complex admittance and thermally stimulated depolarization (TSD) techniques, in the relaxation-time ranges 10 –5 –10 s and 10–10 4 s respectively. The relaxation spectrum was resolved and three components of it were studied. Second-order kinetics...
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Cambridge University Press (CUP)
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crcambridgeupr:10.1017/s0022143000033426 2024-03-03T08:45:58+00:00 Measurements of the Electrical Properties of Ice Ih Single Crystals by Admittance and Thermally Stimulated Depolarization Techniques Loria, Arturo Mazzega, Ezio Pennino, Umberto del Andreotti, Giovanni 1978 http://dx.doi.org/10.1017/s0022143000033426 https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S0022143000033426 en eng Cambridge University Press (CUP) Journal of Glaciology volume 21, issue 85, page 219-230 ISSN 0022-1430 1727-5652 Earth-Surface Processes journal-article 1978 crcambridgeupr https://doi.org/10.1017/s0022143000033426 2024-02-08T08:42:50Z Abstract Ice Ih single crystals were investigated by complex admittance and thermally stimulated depolarization (TSD) techniques, in the relaxation-time ranges 10 –5 –10 s and 10–10 4 s respectively. The relaxation spectrum was resolved and three components of it were studied. Second-order kinetics had to be assumed for two of the TSD spectra to obtain Arrhenius-type relaxation times. The “Debye spectrum” had an activation energy for the relaxation time of 0.64 eV at the high temperatures and its dielectric strength revealed a possible defect cross-over at T c = 190 K. Far below this temperature the activation energy was 0.38 eV, that is about half of that necessary for a pair of ion defects to form. In comparison with the results of other authors, a lower concentration of ionic defects, or possibly of Bjerrum–ion aggregates, was deduced to occur in our crystals. Inert-gas host molecules were proposed as a possible origin of the two other spectra, having relaxation times shorter than the “Debye spectrum” and energies of 0.33 eV and 0.37 eV. Moreover the 0.33 eV spectrum, whose dielectric strength appears at a temperature below T c , might alternatively be related to the cross-over of the “Debye spectrum”. Article in Journal/Newspaper Journal of Glaciology Cambridge University Press Journal of Glaciology 21 85 219 230 |
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Cambridge University Press |
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crcambridgeupr |
language |
English |
topic |
Earth-Surface Processes |
spellingShingle |
Earth-Surface Processes Loria, Arturo Mazzega, Ezio Pennino, Umberto del Andreotti, Giovanni Measurements of the Electrical Properties of Ice Ih Single Crystals by Admittance and Thermally Stimulated Depolarization Techniques |
topic_facet |
Earth-Surface Processes |
description |
Abstract Ice Ih single crystals were investigated by complex admittance and thermally stimulated depolarization (TSD) techniques, in the relaxation-time ranges 10 –5 –10 s and 10–10 4 s respectively. The relaxation spectrum was resolved and three components of it were studied. Second-order kinetics had to be assumed for two of the TSD spectra to obtain Arrhenius-type relaxation times. The “Debye spectrum” had an activation energy for the relaxation time of 0.64 eV at the high temperatures and its dielectric strength revealed a possible defect cross-over at T c = 190 K. Far below this temperature the activation energy was 0.38 eV, that is about half of that necessary for a pair of ion defects to form. In comparison with the results of other authors, a lower concentration of ionic defects, or possibly of Bjerrum–ion aggregates, was deduced to occur in our crystals. Inert-gas host molecules were proposed as a possible origin of the two other spectra, having relaxation times shorter than the “Debye spectrum” and energies of 0.33 eV and 0.37 eV. Moreover the 0.33 eV spectrum, whose dielectric strength appears at a temperature below T c , might alternatively be related to the cross-over of the “Debye spectrum”. |
format |
Article in Journal/Newspaper |
author |
Loria, Arturo Mazzega, Ezio Pennino, Umberto del Andreotti, Giovanni |
author_facet |
Loria, Arturo Mazzega, Ezio Pennino, Umberto del Andreotti, Giovanni |
author_sort |
Loria, Arturo |
title |
Measurements of the Electrical Properties of Ice Ih Single Crystals by Admittance and Thermally Stimulated Depolarization Techniques |
title_short |
Measurements of the Electrical Properties of Ice Ih Single Crystals by Admittance and Thermally Stimulated Depolarization Techniques |
title_full |
Measurements of the Electrical Properties of Ice Ih Single Crystals by Admittance and Thermally Stimulated Depolarization Techniques |
title_fullStr |
Measurements of the Electrical Properties of Ice Ih Single Crystals by Admittance and Thermally Stimulated Depolarization Techniques |
title_full_unstemmed |
Measurements of the Electrical Properties of Ice Ih Single Crystals by Admittance and Thermally Stimulated Depolarization Techniques |
title_sort |
measurements of the electrical properties of ice ih single crystals by admittance and thermally stimulated depolarization techniques |
publisher |
Cambridge University Press (CUP) |
publishDate |
1978 |
url |
http://dx.doi.org/10.1017/s0022143000033426 https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S0022143000033426 |
genre |
Journal of Glaciology |
genre_facet |
Journal of Glaciology |
op_source |
Journal of Glaciology volume 21, issue 85, page 219-230 ISSN 0022-1430 1727-5652 |
op_doi |
https://doi.org/10.1017/s0022143000033426 |
container_title |
Journal of Glaciology |
container_volume |
21 |
container_issue |
85 |
container_start_page |
219 |
op_container_end_page |
230 |
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1792501688930664448 |