Modified image method: Application to the response of layered ohmic conductors to active electromagnetic sources

The standard image method is modified in order to extend its range of applicability to the near-space regime (h∼λ the screening length) for all electromagnetic screening phenomena in conducting matter which are governed by Helmholtz’s equation. The modified method assumes a single image of a near in...

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Published in:Journal of Applied Physics
Main Author: Bergeron, Clyde J.
Format: Article in Journal/Newspaper
Language:English
Published: AIP Publishing 1986
Subjects:
Online Access:http://dx.doi.org/10.1063/1.336733
https://pubs.aip.org/aip/jap/article-pdf/59/11/3901/7990876/3901_1_online.pdf
id craippubl:10.1063/1.336733
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spelling craippubl:10.1063/1.336733 2024-02-11T10:08:34+01:00 Modified image method: Application to the response of layered ohmic conductors to active electromagnetic sources Bergeron, Clyde J. 1986 http://dx.doi.org/10.1063/1.336733 https://pubs.aip.org/aip/jap/article-pdf/59/11/3901/7990876/3901_1_online.pdf en eng AIP Publishing Journal of Applied Physics volume 59, issue 11, page 3901-3908 ISSN 0021-8979 1089-7550 General Physics and Astronomy journal-article 1986 craippubl https://doi.org/10.1063/1.336733 2024-01-26T09:41:16Z The standard image method is modified in order to extend its range of applicability to the near-space regime (h∼λ the screening length) for all electromagnetic screening phenomena in conducting matter which are governed by Helmholtz’s equation. The modified method assumes a single image of a near inducing source and that the effective location of the image plane and surface screening distribution that satisfy the electromagnetic boundary conditions is one screening length below the free surface of the conductor. For applications in which the primary source and detector distance from the conducting free surface is much greater than the appropriate screening length, the modified image method (MIM) reduces to the standard form. An additional ad hoc modification for the case of induced ohmic screening is introduced into Wait’s multilayer correction function Q which is used in the definition of the complex screening length for the MIM model. This results in an extended range of agreement (both as to amplitude and phase )between the complex image fields produced by the MIM model and the secondary field produced by induced currents in the layered conducting half-space as originally formulated by Sommerfeld. This suggests the use of MIM, at least as a first-order tool, for rapid real-time inverse calculations of the structure parameters, conductivities, and thickness of the layers. The good agreement between MIM and the standard theory for a two-layer model occurs over a range of values for the parameters that define the conducting structure and the geometry of the source and sensor coils which are relevant to airborne active electromagnetic source (AEM) coastal bathymetry, sea ice thickness measurements, and studies of salt water intrusions of river deltas and marshes. The success of this application of the MIM model in the near-field regime for ohmic screening suggests the applicability of MIM in calculating the near-field electrostatic and superconducting response of conducting matter as well. Article in Journal/Newspaper Sea ice AIP Publishing Journal of Applied Physics 59 11 3901 3908
institution Open Polar
collection AIP Publishing
op_collection_id craippubl
language English
topic General Physics and Astronomy
spellingShingle General Physics and Astronomy
Bergeron, Clyde J.
Modified image method: Application to the response of layered ohmic conductors to active electromagnetic sources
topic_facet General Physics and Astronomy
description The standard image method is modified in order to extend its range of applicability to the near-space regime (h∼λ the screening length) for all electromagnetic screening phenomena in conducting matter which are governed by Helmholtz’s equation. The modified method assumes a single image of a near inducing source and that the effective location of the image plane and surface screening distribution that satisfy the electromagnetic boundary conditions is one screening length below the free surface of the conductor. For applications in which the primary source and detector distance from the conducting free surface is much greater than the appropriate screening length, the modified image method (MIM) reduces to the standard form. An additional ad hoc modification for the case of induced ohmic screening is introduced into Wait’s multilayer correction function Q which is used in the definition of the complex screening length for the MIM model. This results in an extended range of agreement (both as to amplitude and phase )between the complex image fields produced by the MIM model and the secondary field produced by induced currents in the layered conducting half-space as originally formulated by Sommerfeld. This suggests the use of MIM, at least as a first-order tool, for rapid real-time inverse calculations of the structure parameters, conductivities, and thickness of the layers. The good agreement between MIM and the standard theory for a two-layer model occurs over a range of values for the parameters that define the conducting structure and the geometry of the source and sensor coils which are relevant to airborne active electromagnetic source (AEM) coastal bathymetry, sea ice thickness measurements, and studies of salt water intrusions of river deltas and marshes. The success of this application of the MIM model in the near-field regime for ohmic screening suggests the applicability of MIM in calculating the near-field electrostatic and superconducting response of conducting matter as well.
format Article in Journal/Newspaper
author Bergeron, Clyde J.
author_facet Bergeron, Clyde J.
author_sort Bergeron, Clyde J.
title Modified image method: Application to the response of layered ohmic conductors to active electromagnetic sources
title_short Modified image method: Application to the response of layered ohmic conductors to active electromagnetic sources
title_full Modified image method: Application to the response of layered ohmic conductors to active electromagnetic sources
title_fullStr Modified image method: Application to the response of layered ohmic conductors to active electromagnetic sources
title_full_unstemmed Modified image method: Application to the response of layered ohmic conductors to active electromagnetic sources
title_sort modified image method: application to the response of layered ohmic conductors to active electromagnetic sources
publisher AIP Publishing
publishDate 1986
url http://dx.doi.org/10.1063/1.336733
https://pubs.aip.org/aip/jap/article-pdf/59/11/3901/7990876/3901_1_online.pdf
genre Sea ice
genre_facet Sea ice
op_source Journal of Applied Physics
volume 59, issue 11, page 3901-3908
ISSN 0021-8979 1089-7550
op_doi https://doi.org/10.1063/1.336733
container_title Journal of Applied Physics
container_volume 59
container_issue 11
container_start_page 3901
op_container_end_page 3908
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