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Test

Test(s), testing, or TEST may refer to:

* Test (assessment), an educational assessment intended to measure the respondents' knowledge or other abilities

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141

90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica

by Tsiligiannis, Georgios, Dilillo, Luigi, Bosio, Alberto, Girard, Patrick, Pravossoudovitch, Serge, Virazel, Arnaud, Cocquerez, Philippe, Autran, Jean-Luc, Litterio, Antonio, Wrobel, Frédéric, Saigné, Frédéric
Published in IEEE Transactions on Nuclear Science (2014)
Contributors: “...Test and dEpendability of microelectronic integrated SysTems (TEST)...”

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Select result number 142
142

90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica

by Tsiligiannis, Georgios, Dilillo, Luigi, Bosio, Alberto, Girard, Patrick, Pravossoudovitch, Serge, Virazel, Arnaud, Cocquerez, Philippe, Autran, Jean-Luc, Litterio, Antonio, Wrobel, Frédéric, Saigné, Frédéric
Published in IEEE Transactions on Nuclear Science (2014)
Contributors: “...Test and dEpendability of microelectronic integrated SysTems (TEST)...”

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Article in Journal/Newspaper
Select result number 143
143

90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica

by Tsiligiannis, Georgios, Dilillo, Luigi, Bosio, Alberto, Girard, Patrick, Pravossoudovitch, Serge, Virazel, Arnaud, Cocquerez, Philippe, Autran, Jean-Luc, Litterio, Antonio, Wrobel, Frédéric, Saigné, Frédéric
Published in IEEE Transactions on Nuclear Science (2014)
Contributors: “...Test and dEpendability of microelectronic integrated SysTems (TEST)...”

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Article in Journal/Newspaper
Select result number 144
144

90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica

by Tsiligiannis, Georgios, Dilillo, Luigi, Bosio, Alberto, Girard, Patrick, Pravossoudovitch, Serge, Virazel, Arnaud, Cocquerez, Philippe, Autran, Jean-Luc, Litterio, Antonio, Wrobel, Frédéric, Saigné, Frédéric
Published in IEEE Transactions on Nuclear Science (2014)
Contributors: “...Test and dEpendability of microelectronic integrated SysTems (TEST)...”

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Article in Journal/Newspaper
Select result number 145
145

90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica

by Tsiligiannis, Georgios, Dilillo, Luigi, Bosio, Alberto, Girard, Patrick, Pravossoudovitch, Serge, Virazel, Arnaud, Cocquerez, Philippe, Autran, Jean-Luc, Litterio, Antonio, Wrobel, Frédéric, Saigné, Frédéric
Published in IEEE Transactions on Nuclear Science (2014)
Contributors: “...Test and dEpendability of microelectronic integrated SysTems (TEST)...”

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Article in Journal/Newspaper
Select result number 146
146

Real-Time Testing of 90nm COTS SRAMs at Concordia Station in Antarctica

by Tsiligiannis, Georgios, Dilillo, Luigi, Bosio, Alberto, Girard, Patrick, Pravossoudovitch, Serge, Todri-Sanial, Aida, Virazel, Arnaud, Cocquerez, Philippe, Autran, Jean-Luc, Litterio, Antonio, Wrobel, Frédéric, Saigné, Frédéric
Published 2014
Contributors: “...Test and dEpendability of microelectronic integrated SysTems (TEST)...”

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Select result number 147
147

Real-Time Testing of 90nm COTS SRAMs at Concordia Station in Antarctica

by Tsiligiannis, Georgios, Dilillo, Luigi, Bosio, Alberto, Girard, Patrick, Pravossoudovitch, Serge, Todri-Sanial, Aida, Virazel, Arnaud, Cocquerez, Philippe, Autran, Jean-Luc, Litterio, Antonio, Wrobel, Frédéric, Saigné, Frédéric
Published 2014
Contributors: “...Test and dEpendability of microelectronic integrated SysTems (TEST)...”

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Select result number 148
148

Real-Time Testing of 90nm COTS SRAMs at Concordia Station in Antarctica

by Tsiligiannis, Georgios, Dilillo, Luigi, Bosio, Alberto, Girard, Patrick, Pravossoudovitch, Serge, Todri-Sanial, Aida, Virazel, Arnaud, Cocquerez, Philippe, Autran, Jean-Luc, Litterio, Antonio, Wrobel, Frédéric, Saigné, Frédéric
Published 2014
Contributors: “...Test and dEpendability of microelectronic integrated SysTems (TEST)...”

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Select result number 149
149

Real-Time Testing of 90nm COTS SRAMs at Concordia Station in Antarctica

by Tsiligiannis, Georgios, Dilillo, Luigi, Bosio, Alberto, Girard, Patrick, Pravossoudovitch, Serge, Todri-Sanial, Aida, Virazel, Arnaud, Cocquerez, Philippe, Autran, Jean-Luc, Litterio, Antonio, Wrobel, Frédéric, Saigné, Frédéric
Published 2014
Contributors: “...Test and dEpendability of microelectronic integrated SysTems (TEST)...”

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Select result number 150
150

Real-Time Testing of 90nm COTS SRAMs at Concordia Station in Antarctica

by Tsiligiannis, Georgios, Dilillo, Luigi, Bosio, Alberto, Girard, Patrick, Pravossoudovitch, Serge, Todri-Sanial, Aida, Virazel, Arnaud, Cocquerez, Philippe, Autran, Jean-Luc, Litterio, Antonio, Wrobel, Frédéric, Saigné, Frédéric
Published 2014
Contributors: “...Test and dEpendability of microelectronic integrated SysTems (TEST)...”

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Select result number 151
151

Test of 90nm SRAMs at Concordia Station in Antarctica

by Dilillo, Luigi
Published 2014
Contributors: “...Conception et Test de Systèmes MICroélectroniques (SysMIC)...”

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Select result number 152
152

Test of 90nm SRAMs at Concordia Station in Antarctica

by Dilillo, Luigi
Published 2014
Contributors: “...Conception et Test de Systèmes MICroélectroniques (SysMIC)...”

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Select result number 153
153

Test of 90nm SRAMs at Concordia Station in Antarctica

by Dilillo, Luigi
Published 2014
Contributors: “...Conception et Test de Systèmes MICroélectroniques (SysMIC)...”

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Select result number 154
154

Test of 90nm SRAMs at Concordia Station in Antarctica

by Dilillo, Luigi
Published 2014
Contributors: “...Conception et Test de Systèmes MICroélectroniques (SysMIC)...”

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Select result number 155
155

Real-Time Testing of 90nm COTS SRAMs at Concordia Station in Antarctica

by Tsiligiannis, Georgios, Dilillo, Luigi, Bosio, Alberto, Girard, Patrick, Pravossoudovitch, Serge, Todri-Sanial, Aida, Virazel, Arnaud, Cocquerez, Philippe, Autran, Jean-Luc, Litterio, Antonio, Wrobel, Frédéric, Saigné, Frédéric
Published 2014
Contributors: “...TEST (TEST)...”

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Select result number 156
156

Securing Boot of an Embedded Linux on FPGA

by Devic, Florian, Torres, Lionel, Badrignans, Benoit
Published in 2011 IEEE International Symposium on Parallel and Distributed Processing Workshops and Phd Forum (2011)
Contributors: “...Conception et Test de Systèmes MICroélectroniques (SysMIC)...”

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Select result number 157
157

Securing Boot of an Embedded Linux on FPGA

by Devic, Florian, Torres, Lionel, Badrignans, Benoit
Published in 2011 IEEE International Symposium on Parallel and Distributed Processing Workshops and Phd Forum (2011)
Contributors: “...Conception et Test de Systèmes MICroélectroniques (SysMIC)...”

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Select result number 158
158

Securing Boot of an Embedded Linux on FPGA

by Devic, Florian, Torres, Lionel, Badrignans, Benoit
Published in 2011 IEEE International Symposium on Parallel and Distributed Processing Workshops and Phd Forum (2011)
Contributors: “...Conception et Test de Systèmes MICroélectroniques (SysMIC)...”

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Select result number 159
159

Securing Boot of an Embedded Linux on FPGA

by Devic, Florian, Torres, Lionel, Badrignans, Benoit
Published in 2011 IEEE International Symposium on Parallel and Distributed Processing Workshops and Phd Forum (2011)
Contributors: “...Conception et Test de Systèmes MICroélectroniques (SysMIC)...”

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