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1by Padin, S., Staniszewski, Z., Keisler, R., Joy, M., Stark, A. A., Ade, Peter A. R., Aird, K. A., Benson, B. A., Bleem, L. E., Carlstrom, J. E., Chang, C. L., Crawford, T. M., Crites, A. T., Dobbs, M. A., Halverson, N. W., Heimsath, S., Hills, R. E., Holzapfel, W. L., Lawrie, C., Lee, A. T., Leitch, E. M., Leong, J., Lu, W., Lueker, M., McMahon, J. J., Meyer, S. S., Mohr, J. J., Montroy, T. E., Plagge, T., Pryke, C., Ruhl, J. E., Schaffer, K. K., Shirokoff, E., Spieler, H. G., Vieira, J. D.Get access
Published in Applied Optics (2008)
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2by Bryan, S, Ade, P, Amiri, M, Benton, S, Bihary, R, Bock, J, Bond, JR, Chiang, HC, Contaldi, C, Crill, B, Dore, O, Elder, B, Filippini, J, Fraisse, A, Gambrel, A, Gandilo, N, Gudmundsson, J, Hasselfield, M, Halpern, M, Hilton, G, Holmes, W, Hristov, V, Irwin, K, Jones, W, Kermish, Z, Lawrie, C, MacTavish, C, Mason, P, Megerian, K, Moncelsi, L, Montroy, T, Morford, T, Nagy, J, Netterfield, CB, Padilla, I, Rahlin, AS, Reintsema, C, Riley, DC, Ruhl, J, Runyan, M, Saliwanchik, B, Shariff, J, Soler, J, Trangsrud, A, Tucker, C, Tucker, R, Turner, A, Wen, S, Wiebe, D, Young, EGet access
Published in Review of Scientific Instruments (2015)
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Article in Journal/Newspaper