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A dynamic numerical model to characterize labile metal complexes collected with diffusion gradient in thin films devices

by Tusseau-Vuillemin, M.H., Gilbin, R., Taillefert, M.
Published in Environmental Science & Technology (2003)
Contributors: “...GEOGIA INSTITUTE OF TECHNOLOGY ATLANTA USA...”

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A dynamic numerical model to characterize labile metal complexes collected with diffusion gradient in thin films devices

by Tusseau-Vuillemin, M.H., Gilbin, R., Taillefert, M.
Published in Environmental Science & Technology (2003)
Contributors: “...GEOGIA INSTITUTE OF TECHNOLOGY ATLANTA USA...”

Get access
Get access

Article in Journal/Newspaper